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掩模缺陷规范造成的器件成品率和可靠性问题=Deviceyieldandreliabilityby.specifica-tionofmaskdefects[刊,英]/Wiley,J.N…//SolidStateTechnol.-1993.36(7).-...
Device defect rate and reliability issues caused by mask defects specification = Deviceyieldandreliabilityby. specifica-tionofmaskdefects [Journal, English] / Wiley, J. N ... // SolidStateTechnol. -1993.36 (7). -...