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轻敲模式下原子力显微镜微悬臂探针在接近其基态共振频率的外加驱动下振荡,其末端针尖周期性靠近、远离样品,产生于针尖与样品非线性相互作用过程中的高次谐波信号包含更多的待测样品表面纳米力学特性等方面的信息.通过理论分析、计算,系统地研究了针尖与样品接触时间受样品弹性模量的影响,以及高次谐波幅度与接触时间的关系,获得了通过高次谐波幅度区分待测样品表面弹性性质差异的规律.并在自制的高次谐波成像实验装置上,得到了与理论预期一致的实验结果.
Atomic force microscopy micro-cantilever probe oscillates with a modest tapping mode driven by the ground-state resonance frequency with the tip of the tip oscillating periodically and away from the sample resulting from the higher harmonic signal contained in the non-linear interaction between the tip and the sample More information on the nanomechanical properties of the surface of the sample to be tested, etc. The influence of the contact time between the tip and the sample on the elastic modulus of the sample, the relationship between the amplitude of the higher harmonic wave and the contact time are systematically studied through theoretical analysis and calculation, The laws of the difference of elastic properties on the surface of the sample under test were obtained by the amplitude of the higher harmonics, and the experimental results consistent with the theoretical expectation were obtained on the self-made high harmonic imaging device.