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CMOS集成电路和静态电源电流测试是一项有关产品质量和可靠性改善、设计验证和失效分析的技术。它已被少数公司应用多年,目前作为一项工业手段正受到更广泛的承认。本文由CMOS电路的历史开始介绍了I_(DDQ)测试的起源。再讲述如何用I_(DDQ)测试检测缺陷和故障以提高产品质量。然后,讨论工具和方法、包括测试图形生成软件、硬件仪器、阀值设定、IC设计指南和缺陷诊断。文章后面有许多参考书目。对某一专题感兴趣的读者提供了进一步的帮助。
CMOS integrated circuits and quiescent supply current testing is a technology that improves product quality and reliability, design verification, and failure analysis. It has been used by a few companies for many years and is now being more widely recognized as an industrial tool. This article begins with the history of CMOS circuits and introduces the origins of the I_ (DDQ) test. Then tell how to use I_ (DDQ) test to detect defects and failures to improve product quality. Then, discuss tools and methods, including test graphics generation software, hardware instrumentation, threshold settings, IC design guidelines, and defect diagnostics. There are many bibliographies behind the article. Readers interested in a particular topic provide further assistance.