论文部分内容阅读
本文对以 BCl_3为原料气相渗硼时渗层组织缺陷的形成原因进行了研究,认为渗层与基体间的微孔洞系 BCl_3腐蚀所致,而 H_2的存在可使这一腐蚀作用有所减缓.
In this paper, the reasons for the formation of nitrided layer defects during gas-phase boronizing with BCl3 as a raw material were studied. It is concluded that the micro-cavities between the layer and the matrix are caused by the corrosion of BCl3, while the presence of H2 can slow down the corrosion. .