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选用国产CR-39测量α粒子的实验研究结果表明:该材料经α标准源照射后,加以化学预蚀刻、电化学蚀刻,可得到清晰的树状径迹。在入射条件一致情况下,α粒子注量与产生的径迹密度呈线性关系。相对探测效率为20％。平均本底径迹为0.2个/mm~2。
The experimental results of using the domestic CR-39 to measure the α particles show that the material can be clearly pre-etched by chemical pre-etching and electrochemical etching after being irradiated by α standard source. Under the same incident conditions, the α particle fluence has a linear relationship with the track density. The relative detection efficiency is 20%. The average background track is 0.2 / mm ~ 2.