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为了探索和验证半导体激光器电导数参数与其可靠性的关系,将12个半导体激光器串联后进行高温加速电老化,直到器件不激射。监测在加速老化过程中半导体激光器电导数参量的变化情况。通过分析老化期间监测的数据,发现电导数曲线在阈值电流处的下沉高度随着老化时间的增加而变小;结特征参量与电导数曲线(在大于阈值电流的工作状态下)在电流I=0处的截距值随着老化过程逐渐变大。并且结特征参量的变化量在早期处于比较小的平稳状态,然后快速增加到一定值并保持一段时间,之后快速下降并最终稳定在比较小的值,这说明器件退化分为3个阶段:在早期退化较慢,之后退化很快并保持一定的退化速度,最后又到了慢速退化期。从实验结果得知电导数参量与器件的寿命和老化程度有密切关系,并且电导数参数可表征半导体激光器的退化状态。
In order to explore and verify the relationship between the conductivity parameters of semiconductor laser and its reliability, 12 semiconductor lasers are accelerated in series at high temperature until the device is not lased. Monitor the changes of the conductivity parameters of the semiconductor laser during accelerated aging. By analyzing the data monitored during the aging period, it is found that the height of sinking of the conductance curve at the threshold current decreases with the increase of the aging time. The junction characteristic parameter and the conductance curve (under the operating state greater than the threshold current) The intercept value at 0 gradually becomes larger as the aging process progresses. And the change of the junction characteristic parameters is relatively steady at an early stage, then rapidly increases to a certain value for a certain period of time, then rapidly decreases and finally stabilizes at a relatively small value, indicating that the device degradation is divided into three stages: at Early degradation is slow, then quickly degenerate and maintain a certain rate of degeneration, and finally reached a slow degeneration. From the experimental results, it can be concluded that the parameters of the conductance are closely related to the lifetime and aging of the device, and the parameters of the conductance can characterize the degradation of the semiconductor laser.