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介绍了扫描电镜（SEM）电子通道衬度（ECC）技术．该技术可以很好地观察材料中位借结构，用这种技术观察受循环载荷作用的铜单晶中的典型位错结构，与常规的TEM方法观察结果基本一致．
The scanning electron microscopy (SEM) electron channel contrast (ECC) technique is introduced. This technique can be used to observe the structure of the material lent structure. By using this technique, we can observe the typical dislocation structure in the copper single crystal under cyclic loading, which is basically consistent with the conventional TEM method.