论文部分内容阅读
用平面干涉仪的未镀膜标准平板检验已镀膜的光学平板时,由于二者反射率的差异较大致使干涉条纹对比度显著下降,甚至失去检验能力。
When uncoated standard plates with flat interferometers are used to inspect coated optical plates, the contrast contrast of the interference fringes drops significantly due to the large difference in reflectance between the two. Even the inspection capability is lost.