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为探讨电晕放电对复合薄膜绝缘的损伤过程,参照GB/T 22689—2008标准,利用扫描电镜(SEM)、能谱仪(EDS)、红外光谱仪(FTIR)研究了PI/Al_2O_3薄膜在电晕放电下老化至击穿的整个过程。实验结果表明:随着电晕放电时间的延长,电晕破坏区的表面被破坏的越来越严重,表面的有机物逐渐减少,氧化铝越来越多,膨松的氧化铝在表面形成了连续覆盖层。电晕老化击穿后形成的击穿孔为20μm左右的圆形孔洞,定位击穿孔的位置发现击穿孔并不在电晕放电破坏的区域内,而在中心处不易散热的区域,这说明电晕老化击穿并不是传统的电击穿和电化学击穿引起的,而是由于电晕放电产生的热量积累引起材料发生了热击穿。
In order to investigate the damage process of corona discharge to composite thin film insulation, according to the standard of GB / T 22689-2008, the influence of corona discharge on the corona discharge of PI / Al 2 O 3 thin film was studied by scanning electron microscope (SEM), energy dispersive spectrometer (EDS) and infrared spectroscopy (FTIR) Aging to breakdown throughout the discharge process. The experimental results show that with the extension of corona discharge time, the surface of corona damaged area is damaged more and more, the surface organic matter is gradually reduced, the alumina is more and more, and the bulky alumina forms on the surface continuously Cover. Corona aging puncture formed after the breakdown hole is about 20μm circular hole, the location of the location of the puncture hole found in the corona discharge damage is not damaged area, but not easy to heat in the center of the region, indicating corona aging Breakdown is not caused by conventional electrical breakdown and electrochemical breakdown, but thermal breakdown of the material due to heat build-up due to corona discharge.