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研究了存在于聚合物发光二极管 ( PL ED)中的一种可逆的“负阻”现象及短期衰退行为 .当加在 PLED上的正向偏压大于 1 0 V之后 ,其电流和发光强度将在某偏压下出现突然的转折 ,即电流或光强骤增而器件上压降减小 .“负阻”现象将随测量次数的增加而逐渐消失 .采用 CCD摄像头摄取发光象素上发光的变化情况的图像 ,发现光强的突变与电流的突变是相对应的 .对以不同极性脉冲偏置观察发光光强的短期衰退情况时发现 ,反向偏置有助于抑制正向的发光衰退行为 .我们初步认为这些现象可能与 PLED中存在的缺陷态及其上电荷的填充状况有关
A reversible “negative resistance” phenomenon and short-term degradation behavior in PLEDs was investigated. When the forward bias applied to the PLED was greater than 10 V, the current and luminous intensity A sudden transition occurs under a bias voltage, ie, the current or light intensity suddenly increases and the voltage drop on the device decreases. “Negative resistance” will gradually disappear with the increase of the number of measurements. Using a CCD camera to capture the luminescence of a luminescent pixel It is found that the abrupt change of light intensity corresponds to the abrupt change of current.It is found that the reverse bias helps to suppress the forward light emission when observing the short-term decay of light intensity with different polarity impulse bias Recession behavior.We initially consider these phenomena may be related to the PLED in the presence of defects and the charge on the filling of the state