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本文用会聚束电子衍射对纯AI中小角度晶界和亚晶界两侧晶体的取向差进行了精确的测定.定量计算结果:AI中小角度晶界的取向差为1.55°±0.051°.亚晶界的取向差为0.32°±0.037°.并对单个刃位错产生的错向角进行了测量,结果是:0.22°±0.036°.同时对该方法的精度与误差进行了分析。最后对小角度晶界和亚晶界的位错网络结构、晶界类型等问题进行了探讨.
In this paper, the electron beam diffraction of pure AI in the small-angle grain boundaries and subgrain boundaries on both sides of the crystal orientation difference was measured.Results of quantitative calculation: AI small-angle grain boundary orientation difference of 1.55 ° ± 0.051 °. Sub-crystal The difference between the orientations is 0.32 ° ± 0.037 °, and the misorientation angle of a single edge dislocation is measured, the result is 0.22 ° ± 0.036 °. The accuracy and error of this method are also analyzed. Finally, the dislocation network structures and grain boundary types in the small-angle and subgrain boundaries are discussed.