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We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell.Due to the by-pass current,the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample.For the consideration of high accuracy of resistivity measurement,a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer.With this highly insulating layer,the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.