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[目的]该研究旨在明确甜玉米不同生育期生长指标与光谱仪冠层光谱参数的定量关系,进而为甜玉米生长指标快速监测提供决策依据。[方法]通过开展基于正甜68的不同施钾水平的田间试验,于拔节期、大喇叭口期以及抽雄期利用CGMD302光谱仪采集玉米冠层光谱反射率,并同步测定各处理株高、茎粗、叶面积指数等生长指标数据,研究各光谱参数与生长指标之间的关系。[结果]归一化植被指数NDVI与茎粗和LAI呈正相关关系,而比值植被指数RVI与茎粗和LAI呈负相关关系,基于NDVI和RVI构建的单个时期监测模型可以有效地反演甜玉米茎粗和LAI,模型检验结果良好,预测精度均达到0.9以上,均方根误差均小于10%,平均相对误差均小于5%。[结论]该研究结果可为甜玉米生长指标快速监测提供技术依据。
[Objective] The purpose of this study was to determine the quantitative relationship between growth index of sweet corn at different growth stages and canopy spectral parameters of sweet corn, and to provide a basis for rapid monitoring of sweet corn growth index. [Method] With field experiments based on different potassium levels of Zhengtie 68, the spectral reflectance of maize was collected by CGMD302 spectroscopy at jointing stage, boll stage and tasseling stage. The plant height, stem diameter , Leaf area index and other growth indicators data to study the relationship between the spectral parameters and growth indicators. [Result] There was a positive correlation between normalized NDVI and stem diameter and LAI, while the ratio of vegetation index RVI was negatively correlated with stem diameter and LAI. Based on NDVI and RVI, a single period monitoring model could effectively invert sweet corn Stem diameter and LAI, the model test results were good, the prediction accuracy reached above 0.9, the root mean square error was less than 10%, the average relative errors were less than 5%. [Conclusion] The results of this study could provide technical basis for the rapid monitoring of sweet corn growth index.