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扫描力显微镜(SFM)作为一种新型的超分辨率近场扫描探针显微仪器正日益受到各学科领域的高度重视.在铁电材料领域,SFM是开展纳米尺度铁电畴结构成像、纳米尺度畴结构控制及纳米尺度微区的铁电性、介电性、压电性等特性研究的潜在的强有力的研究工具.本文就纳米尺度铁电畴的扫描力显微镜的成像原理的研究进展作一综述.
As a new type of super-resolution near-field scanning probe microscopy instrument, scanning force microscope (SFM) is getting more and more attention in all disciplines.In the field of ferroelectric materials, SFM is to carry out nanoscale ferroelectric domain imaging, Scale domain structure control and research on ferroelectric, dielectric and piezoelectric properties of nanoscale microdomains.In this paper, the research progress in the imaging principle of scanning force microscopy for nanoscale ferroelectric domains Make a review