【摘 要】
：
Thanks to the boom of the China semiconductor industry, there is a huge demand for VLSI test professionals in the market.However, due to the inadequacies in VLSI test education and research in the pas
【机 构】
：
High Performance Analog Division, Texas Instruments Incorporated,USA Dallas, TX 75243
论文部分内容阅读
Thanks to the boom of the China semiconductor industry, there is a huge demand for VLSI test professionals in the market.However, due to the inadequacies in VLSI test education and research in the past, there exists a big gap between university education and industry needs. In this paper, the authors introduce how Teradyne and the School of Microelectronics of Shanghai Jiao Tong University came together to try to fix this problem. A newly developed course called VLSI Packaging & Testing was offered to the students in the fall semester of 2007. The authors focus on the logics and philosophies in developing the course materials to ensure it to be well received by the students.The course turned out to be a big success and could be used as a model to encourage more collaboration between the semiconductor industry and the academic world in order to effectively and efficiently address the new challenges as the semiconductor technology advances.
其他文献
CAN总线的强实时性和高可靠性使得它在航空机电管理系统通讯领域很有竞争力,国内外对单余度CAN总线的应用和测试也已经很普遍了.随着人类对航空安全的要求越来越高,双余度CAN总线的研究和实现成为了我们研究的新课题。本文介绍了容错双余度CAN总线测试平台的研究和设计.测试环境由若干节点机组成.节点机由PC机和本实验时自主开发的CAN板卡组成(其中PC机和CAN板卡通过PCI插槽进行通讯,两者之间的通讯
In order to prolong the lifetime of wireless sensor networks, we did some exploring researches on the topology control of the wireless sensor networks. This paper proposes a Fault Tolerant Routing Pro
为了提高Internet的性能,网络研究人员不断提出新的网络协议和网络服务,在进行实际的部署前需要一个真实可控的网络测试床来进行有效测试和性能评估.本文针对这一需求,对虚拟化技术进行了研究,在以PC为基础的局域网上,解决了物理资源分割、网络接口虚拟化、数据包转发引擎和路由计算进程等四个测试床设计的关键问题,实现了一个基于虚拟化技术的网络测试床.并通过若干实验验证了该测试床的可用性、真实性和可控性,
针对模拟电路的故障诊断问题,讨论了一种基于有向无环图支持向量机分类器(DAGSVC)的故障字典新方法,并提出一种评估支持向量机分类器的测试复杂度指标。首先,对电路施加一定的测试激励,利用可测节点采集电路响应;其次,对采集的电路响应进行特征提取形成训练样本,并建立“l-v-l”SVMs进行训练,训练完毕并构建故障字典;最后,建立DAGSVC结构对未知样本加以测试.通过对一个模拟滤波器的实际测试和验证
A new analysis method based on node-voltage increments relation function (NVIRF) for soft fault diagnosis of analog circuits is described. In linear analog circuits, the NVIRF is a linear function, th
为了降低模拟电路参数型故障的测试难度,研究了一种基于重叠正交变换(LOT)的模拟电路故障诊断方法。将测试响应经滤波器组完成子带滤波,随后对各子带滤波序列计算故障子序列与正常子序列的互相关系数,对每一故障,可确定出互相关系数最小的子带,并将此数值作为该故障的特征,对应子带的正常响应序列的自相关系数作为无故障特征,用故障特征与正常特征的对比可诊断故障.对国际标准电路的实验表明,该方法可诊断模拟集成电路
Functional testing of todays highly complex devices offers many challenges. Digital device tests include both traditional deterministic pattern tests and digital tests that produce variable data outpu
CSP(Constraint Satisfaction Problem)求解部分是目前很多系统的核心部分,对其进行研究有重要作用,本文提出的算法能够解决约束为实数域上由初等函数复合而成的CSP问题。CSP的核心问题就是如何快速求出一组数据使其满足特定几个约束.目前实数域上的CSP问题的求解算法,基本上都是基于迭代或启发式的.这类算法的缺点是不能保证算法一定能够返回一组解.本文提出一种使用区间运算和
概念关联可以从程序中提取具有领域知识和语义内聚度的概念片段.把概念片段用于程序切片准则可以生成具有领域概念的切片,但切片准则增大的同时可能会引发切片尺寸的急剧增大,从而导致无法在实际中应用。本文重新定义了适用于概念切片的度量准则,覆盖度和重合度,研究了切片准则的语义内聚度和相应依赖性的关系。基于5个开放源代码程序的实验结果表明,程序片段内的概念和语义内聚度可以增强片段内语句之间依赖性关系。这种性质
本文提出了一种利用蚁群算法实现程序主变元分析与确定的方法,使用属性约简模型,将输入/输出变量间的相互关联关系作为启发式信息引入蚁群算法来分析程序主变元.实验结果表明,本方法是行之有效的,可以更为准确地确定程序主变元.