Rapid thermal annealing for α-Si/metal/semiconductor waveguide for active control of surface plasmon

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  The influence of Au/Ni-based ohmic contact formed on the lowly doped (7.3×1017cm-3,Zn-doped) InGaAsP films to active control of surface palsmon po-laritons (SPPs) propagation under various rapid thermal annealing (RTA) conditions has been studied.
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