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Effects of CeO2 Buffer Layers Thickness on the Orientation and Dielectric Properties of Ba(Zr0.20Ti0
【机 构】
：
Functional Materials Research Laboratory,Tongji University,1239 Siping Road,Shanghai,China
【出 处】
：
The 2nd International Syposium on Innovations in Advanced Ma
【发表日期】
：
2008年期
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