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  5. Double-shot optical sectioning microscopy with structured illumination

Double-shot optical sectioning microscopy with structured illumination

来源 :The 4th Advances in Optoelectronics and Micro/nano-optics (A | 被引量 : 0次 | 上传用户：abc135abc
【摘 要】
：
Structured illumination microscopy (SIM) has the axially sectioning capability due to the rejection of out-of-focus portion of image by patterned illumina-tion.To obtain a single sectioned slice of sa
【作 者】
：
Xing Zhou Dan Dan Ming Lei Jia Qian Baoli Yao Tong Ye Di Wu Yanlong Yang Runze Li Tong Peng 
【机 构】
：
State Key Laboratory of Transient Optics and Photonics,Xi'an Institute of Optics and Precision Mech
【出 处】
：
The 4th Advances in Optoelectronics and Micro/nano-optics (A
【发表日期】
：
2014年5期
【关键词】
：
optical sectioning Structured illumination microscopy 
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　　Structured illumination microscopy (SIM) has the axially sectioning capability due to the rejection of out-of-focus portion of image by patterned illumina-tion.To obtain a single sectioned slice of sample,three sub-images with a phase-shift of 2n/3 between two adjacent images are acquired.In this paper,anovel structured illumination microscope by using a digital micro-mirror device (DMD) for fringe projection is applied to capture structured illumination im-ages.
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