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[期刊论文] 作者：Zai-Fang Zhang,Yuan Liu,Xiao-Song Wu,Shu-Lin Kan,,
来源：Advances in Manufacturing 年份：2014
For the typical color defects of polysilicon wafers,i.e.,edge discoloration,color inaccuracy and color non-uniformity,a new integrated machine vision detection method is proposed based on an HSV color...
[期刊论文] 作者：Egon Ostrosi,Alain-Jér(o)me Fougères,Zai-Fang Zhang,Josip Stjepandi(c),
来源：先进制造进展（英文版） 年份：2021
Presently,modular designs use various technologies accompanied by multiple models.Although no integral solution is known,a plethora of approaches is used to res...
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