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[期刊论文] 作者:Gopi Krishna Saramekala,Sarvesh Dubey,Pramod Kumar Tiwari, 来源:中国物理B(英文版) 年份:2015
In this paper, a surface potential based threshold voltage model of fully-depleted (FD) recessed-source/drain (Re-S/D) silicon-on-insulator (SOI) metal-oxide se...
[期刊论文] 作者:Gopi Krishna Saramekala,Sarvesh Dubey,Pramod Kumar Tiwari,, 来源:Chinese Physics B 年份:2015
In this paper, a surface potential based threshold voltage model of fully-depleted(FD) recessed-source/drain(Re-S/D)silicon-on-insulator(SOI) metal-oxide semico...
[期刊论文] 作者:Pramod Kumar Tiwari,Gopi Krishna Saramekala,Sarvesh Dubey,Anand Kumar Mukhopadhyay,, 来源:Journal of Semiconductors 年份:2014
The present work gives some insight into the subthreshold behaviour of short-channel double-materialgate strained-silicon on silicon–germanium MOSFETs in terms...
[期刊论文] 作者:Pramod Kumar Tiwari,Mukesh Kumar,Ramavathu Sakru Naik,Gopi Krishna Saramekala,, 来源:Journal of Semiconductors 年份:2016
This work presents a comparative study of the influence of various parameters on the analog and RF properties of silicon-nanotube MOSFETs and nanowire-based gat...
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