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[期刊论文] 作者:M.Nasir Bashir,A.S.M.A.Haseeb,Abu Zayed Mohammad Saliqur Rahman,M.A.Fazal,, 来源:Journal of Materials Science & Technology 年份:2016
Rapid Cu diffusion is one of the main causes of electromigration(EM) failure in lead-free solder joints.In this study, an effort has been made to investigate th...
[会议论文] 作者:Abu Zayed Mohammad Saliqur Rahman,Xingzhong Cao,Peng Zhang,Zhuoxin Li,Runsheng Yu,Baoyi Wang,Long Wei, 来源:第十一届全国正电子湮没谱学会议 年份:2012
  Single crystals of α-Al2O3 were irradiated with reactor neutron and high energy electrons (1.9 GeV).Positron annihilation lifetime (PAL),coincidence Dopple...
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