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1996年12月8～13日在印度首都新德里举行了第14届世界无损检测会议。本文试图就这次会议情况分析国内外工业CT技术的发展现状。 1 从会议论文数看工业CT技术 这次会议共出版了五大卷论文集,约2700页,论文总数超过550篇,内容几乎涵盖或涉及了当今无损检测与评价(NDT&E)的各个方面。工业CT技术共有8篇论文进行了宣读,2篇展示论文。报告时,会场人员突然增多,说明与会人员十分关心工业CT技术领域的发展情况。但是,在第三卷论文集中,专门介绍工业CT技术的论文仅有10篇(另4篇在其它卷中),内容主要介绍工业CT技术的应用与发展。其中直接与工业CT设备有关的仅有3篇,一篇重庆大学ICT研究中心的γ-CT,另两篇为俄罗斯和印度的X-CT。由此可见,尽管工业CT技术
The 14th World Nondestructive Testing Conference was held in New Delhi, capital of India, from December 8 to December 1996. This article attempts to analyze the current situation of industrial CT technology at home and abroad. 1 From the number of conference papers to see the industrial CT technology The conference has published a total of five volumes of essays, about 2,700 pages, the total number of papers over 550, covering or covering almost all aspects of today’s NDT (NDT & E). A total of 8 papers were read in the industrial CT technology and 2 were dissertations. At the time of the report, there was a sudden increase in the number of staff in the venue, indicating that participants were very concerned about the development of industrial CT technology. However, in the third volume of the essay, there are only 10 papers devoted to industrial CT technology (the other 4 volumes are in other volumes), which mainly introduces the application and development of industrial CT technology. There are only 3 directly related to industrial CT equipment, a γ-CT of Chongqing University ICT Research Center and the other two are X-CT of Russia and India. Thus, despite the industrial CT technology