利用Ｘ射线步长扫描衍射数据和全图谱（Ｗｈｏｌｅ－ｐａｔｔｅｒｎ）拟合技术（Ｒｉｅｔｖｅｌｄ方法），通过相含量和Ｒｉｅｔｖｅｌｄ修正中标度因子之间存在的简单关系，对包含不同重量的水晶和刚玉粉末的混合物样品进行了相含量的定量分析．求得的结果与原始配比一致，说明这一技术可以有效地用于多相粉末，尤其是衍射图谱严重重叠样品的定量分析研究． By using the X-ray step scanning diffraction data and the Whole-pattern fitting technique (Rietveld method), the simple relationship between the phase content and the scaling factor in Rietveld correction The mixture samples were quantitatively analyzed for phase content. The obtained results are consistent with the original ratio, indicating that this technique can be effectively applied to the quantitative analysis of heterogeneous powders, especially those with serious overlapping diffraction patterns.