本文提出了用普通微波圆波导测量系统测量手性材料复手性参数的方法。该方法还能同时测量手性材料复介电常数和复磁导率。为了得到手性参数，首先需要测量短路（样品后有金属板）和开路（样品后无金属板）时的复反射系数，及电磁波通过手性材料后的偏转角和轴比。测量结果与自由空间法的测量结果一致。 This paper presents a method of measuring chiral complex chiral parameters using a conventional microwave circular waveguide measurement system. The method can simultaneously measure the complex permittivity and complex permeability of chiral materials. In order to get the chiral parameter, we first need to measure the complex reflection coefficient of the short circuit (metal plate after the sample) and open circuit (no metal plate after the sample), and the deflection angle and axial ratio of the electromagnetic wave after passing through the chiral material. The measurement results are consistent with those obtained from the free space method.