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压控振荡器(VCO)、YIG振荡器(YTO)等大漂移器件的相位噪声测试一直是测试领域的难题,本文详细介绍了利用延迟线法对该类器件进行相位噪声测试的原理和应用情况。
Phase noise testing of large-drift devices such as VCOs and YIG oscillators (YTOs) has always been a challenge in the field of testing. This paper describes in detail the principle and application of phase-delay testing of such devices using delay line techniques .