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采用光学显微镜、透射电镜观察、硬度及单向拉伸测试,研究了双级均匀化制度对7055合金微结构与性能的影响。结果表明:与单级均匀化相比,双级均匀化处理的初级低温保温过程有利于原始晶界附近低Zr区域的Al3Zr弥散析出;双级均匀化处理后无沉淀析出带(PFZ)变窄,晶界附近Al3Zr粒子密度增加;弥散分布的Al3Zr粒子通过钉扎晶界与拖曳位错,有效地抑制了再结晶,以至于经热轧固溶后再结晶百分数降低40%左右;保留下来的大量位错和未再结晶组织,提高了合金T6态力学性能。
The effects of two-stage homogenization on microstructure and properties of 7055 alloy were investigated by optical microscope, transmission electron microscopy, hardness and uniaxial tensile test. The results show that compared with single-stage homogenization, the primary low-temperature heat preservation process of double-stage homogenization is conducive to the dispersion of Al3Zr in the low-Zr region near the original grain boundary. After double-stage homogenization, no precipitation precipitation zone (PFZ) , The grain size of Al3Zr near the grain boundary increases. The dispersed Al3Zr particles effectively inhibit the recrystallization by pinning the grain boundaries and dragging dislocations, so that the percentage of recrystallized grains decreases by about 40% A large number of dislocations and non-recrystallized structure improve the T6 mechanical properties.