第七讲 自动光圈控制和自动曝光控制

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一、自动聚焦状态检测在自动聚焦控制原理和工作电路分析的基础上,我们对内检测方式的自动聚焦状态检测进行分析。内检测方式目前普遍采用新TTL方式,该方式通过检测摄取信号的高频分量来进行聚焦移位。为实现快速而又正确地控制聚焦镜的移位,除了利用压电元件使CCD摄像器件作微小移动来检测信号高频分量的变化极性之外,还需将变聚镜位置以及光圈位置信息,馈送到聚焦控制微机。这两者的位置与被摄物的景深密切相关,会影响被摄信号高频分量的变化。它们与聚焦镜位置信息一样,对聚焦控制微机的状态判断同等重要。 First, the automatic focus state detection In the automatic focus control principle and analysis of the working circuit, based on the detection of the way we focus on the state of the auto-focus analysis. The new TTL method is commonly used in the inner detection method, and the focus shift is performed by detecting the high frequency component of the ingested signal. In order to control the displacement of the focusing lens quickly and accurately, besides detecting the changing polarity of the high-frequency component of the signal by using the piezoelectric element to slightly move the CCD imaging device, the position of the focusing lens and the position information of the aperture , Fed to the focus control microcomputer. The location of both is closely related to the depth of field of the subject, which can affect the high-frequency component of the signal being shot. They are the same as the focusing mirror position information, to determine the status of the focus control microcomputer is equally important.
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