论文部分内容阅读
本文采用介质谐振器法测量高T_C超导材料微波表面电阻。上下端面被金属板短路的介质谐振器构成TE_(011)模式,将其中一个底板置换为被测超导样品,通过测试其无载品质因素Q_0和谐振频率f_0的变化,计算测试样品的微波表面电阻。实验证明,这种方法具有重复性好,测试稳定的特点,可以对高T_C超导块材和薄膜样品进行非损伤测试。
In this paper, the dielectric resonator method to measure the microwave surface resistance of high T_C superconducting materials. The upper and lower end faces are modeled as TE_ (011) by a dielectric resonator shorted by a metal plate. One of the bottom plates is replaced by a superconducting sample under test, and the change of the unloaded quality factor Q_0 and the resonant frequency f_0 is calculated to calculate the microwave surface resistance. Experiments show that this method has the characteristics of good repeatability and stable test, which can test non-damage of high T_C superconducting bulk and thin film samples.