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本文中描述用振幅峰值的方法,测量面接触型晶体管OC70,OC71和点接触型晶体管2N32A内窄频带低频率噪声的振幅分布。测量结果证明窄频带晶体三极管噪声的振幅分布,和遵守正态律的振幅分布相符合。
Described herein is a method of measuring the amplitude distribution of low-frequency, narrow-band noise in the surface-contact type transistors OC70 and OC71 and the dot-contact type transistor 2N32A using the peak amplitude. The measurement results show that the amplitude distribution of narrow-band transistor noise is consistent with the normal distribution of amplitude.