Ag/[BN/Copt]5/Ag and [BN/Ag/CoPt]5/Ag thin films were deposited on glass substrates by magnetron sputtering and then annealed in vacuum at 600℃ for 30 min.The structures and magnetic properties of CoPt/BN multilayer films were investigated as a function of Ag layer thickness.It was found that the face-centered tetragonal(fct)(001)texture of Copt was improved greatly by introducing the Ag toplayer or sublayer together with an Ag underlayer.Good(001)-oriented growth,low intergrain interactions as well as high perpendicular anisotropy can be obtained in the Ag(3 nm)/[BN(2.5 nm)/CoPt(3 nm)]5/Ag(7 nm)and[BN(2.5 nm)/Ag(2 nm)/CoPt(3 nm)]5/Ag(10 nm)films,which become potential candidates for ultrahigh density magnetic recording media.