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扫描隧道显微镜(SEM)和原子力显微镜(AFM)具有原子级的极高分辨率,可在纳米尺度上获得实空间的表面微观三维形貌,且可定量表征,因此可用来研究材料断裂与疲劳的微观机理。简要介绍STM和AFM在该领域的应用及所取得的若干进展。
Scanning tunneling microscopy (SEM) and atomic force microscopy (AFM) have very high resolution at the atomic level and can obtain the microscopic three-dimensional topography of the real space on the nanoscale and can be quantitatively characterized. Therefore, it can be used to study the fracture and fatigue of materials Micro-mechanism. Briefly introduce the application of STM and AFM in this field and some progress made.