本文用爆裂噪声表征总剂量电离辐射(TID)对光电探测器组件的损伤情况。通过对辐照前后的光电探测器组件进行噪声测试,然后对比分析其结果。实验结果表明,总剂量辐照后,相对于辐照前,光电探测器组件内部明显出现了爆裂噪声,即组件内部出现了大量缺陷,导致组件的可靠性降低。 In this paper, the burst noise is used to characterize the damage of photodetector components by total dose ionizing radiation (TID). Through the noise before and after the photodetector assembly noise test, and then comparative analysis of the results. The experimental results show that after the total dose irradiation, the burst noise appears obviously in the photodetector assembly before irradiation, that is, there are a lot of defects inside the assembly, which leads to the decrease of the reliability of the assembly.