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提出了一种利用同步辐射光源测量晶体衍射效率的实验方法,通过对Si(111)标样衍射效率理论数据的分析与修正,验证了此方法的合理性和可靠性。指出光源的发散度与晶体的衍射效率密切相关。
An experimental method for measuring the diffraction efficiency of crystal using synchrotron radiation source is proposed. The rationality and reliability of this method are verified by analyzing and correcting the diffraction efficiency of Si (111) standard. It is pointed out that the divergence of the light source is closely related to the diffraction efficiency of the crystal.