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用接触法探测凸面工件时,由于曲率的影响,工件与晶片振子不能完全接触,只能局部通过耦合剂耦合接触,致使传入工件的超声能量减弱,声强降低,工作灵敏度比平探头与平表面耦合时获得的灵敏度低,无法对被检件实施可靠的检测。因此,如何利用与被检件相同超声特性的平面参考试块,用补偿外曲
When the convex workpiece is detected by contact method, the workpiece and the chip oscillator can not be completely contacted due to the curvature. Only the coupling coupling can be carried out locally by the coupling agent, which leads to the weakening of the ultrasonic energy introduced into the workpiece and the reduction of the sound intensity, and the working sensitivity is lower than that of the flat probe The sensitivity obtained when the surface is coupled is low, so that reliable inspection of the test piece can not be performed. Therefore, how to make use of the same reference surface of the test piece with the ultrasonic characteristics of compensation,