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一、序言为了掌握电子元件和材料的寿命特性,人们往往利用了可靠性试验数据和实际使用数据这一字眼。而后者的实际使用数据虽能获得十分巨大的元件小时数,但是由于存在着各种取样或取样之间的应力变动以及随系统的不同而失效的定义和保护方式也不同等理由,所以存在这样一个缺点,即推算出来的寿命分布参数及其可靠区间不准确。因此,由两者的数据求出的失效率仅是与经验系数(K 因子)相关联,至于与推算出的参数之间的关系尚未进行深入研究。
I. Preface In order to grasp the life characteristics of electronic components and materials, people often make use of the reliability test data and actual usage data. While the latter’s actual usage data can obtain very large component hours, there are such reasons as there is a variety of sampling and sampling stress changes and the failure of the system definition and protection of different systems A disadvantage is that the calculated lifetime distribution parameters and their reliable intervals are inaccurate. Therefore, the failure rate calculated from the two data is only related to the empirical coefficient (K factor), and the relationship with the estimated parameters has not been further studied.