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本文提出了把DEPT技术用于不灵敏核T_1测量的一个方案。实验表明,该方案不仅保持了DEPT技术的固有优点,而且在节省测量时间和简化T_1计算等方面显示了附加的优越性。
In this paper, we propose a scheme using DEPT technique for the insensitive T_1 measurement. Experiments show that this scheme not only maintains the inherent advantages of DEPT technique, but also shows additional advantages in terms of saving measurement time and simplifying T_1 calculation.