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在量子隧道效应的基础上，建立了适用于平坦表面的扫描隧道显微镜微观轮廓测量的数学模型，并采用傅里叶变换方法对该模型进行了仿真验证。仿真结果表明，该模型较好地反映了扫描隧道显微镜对样品表面轮廓的测量过程。最后，文中还对该模型的适用范围进行了讨论。
Based on the quantum tunneling effect, a mathematical model of the microscopic profile of scanning tunneling microscopy for flat surface was established. The model was verified by the Fourier transform method. The simulation results show that the model better reflects the measurement of the surface profile of the sample by the scanning tunneling microscope. Finally, the paper also discusses the scope of application of the model.