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提出一种基于结构光条纹成像的光线追迹和波前重建方法。以结构光条纹相位为信息载体,采用相移技术精确地测量结构光条纹成像过程中相位的变化,实现高分辨的光线追迹,得到点列图。由于光线传播方向与波前垂直,因此可以实现波前重建。将一个液晶显示器(LCD)置于点光源后,显示正弦灰度调制光栅图样以产生标准条纹光束。条纹光束通过被测光学元件后,发生变形。CCD记录下变形条纹图样,根据相移技术进行处理,计算后完成测量。由于调制光栅图样是由计算机产生的,所以光栅的周期和方向可以灵活设置,并可以实现精确的相移。实验验证了该方法的可行性。
A ray tracing and wavefront reconstruction method based on structured light streak imaging is proposed. Taking the phase of the structured light stripe as the information carrier, the phase shift technique was used to accurately measure the phase change during the structured light stripe imaging process, and the high-resolution ray tracing was realized. Since the direction of light propagation is perpendicular to the wavefront, wavefront reconstruction can be achieved. After placing a liquid crystal display (LCD) on a point light source, a sinusoidal gray scale grating pattern is displayed to produce a standard striped beam. Striped beam through the optical element under test after deformation. The CCD records the deformed fringe pattern, processes it according to the phase shift technique, and calculates to complete the measurement. Since the modulated raster pattern is computer generated, the grating period and direction can be set flexibly and precise phase shifts can be achieved. The experiment verifies the feasibility of this method.