论文部分内容阅读
提出了一种采用超大规模集成电路的边界扫描测试技术来设计内建自测试 (BIT)电路的方法。此方法利用一片单片机的 I/ O口线以及超大规模集成电路所具有的边界扫描测试结构来实现对 VL SI集成电路芯片的故障诊断。
A method of designing a built-in self-test (BIT) circuit using boundary-scan testing of very large scale integrated circuits is proposed. This method uses the I / O line of a singlechip and the boundary scan test structure of a very large scale integrated circuit to realize the fault diagnosis of the VLSI integrated circuit chip.