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本文介绍采用日本“武田理研”研制的T—320测试仪,测试Intel—3000系列微处理器组件的功能和直流参数,并对测试结果作了简单分析。文中介绍的方法也适用于其它微处理器组件和一般中、大规模集成电路的测试。
This article describes the use of Japan’s “Takeda Rika” T-320 tester developed to test the Intel-3000 series microprocessor functions and components of the DC parameters, and the test results made a simple analysis. The method described in this article also applies to other microprocessor components and general, large scale integrated circuit test.