讨论 ５ Ｘ 密度磁光盘模压特性检测系统中的关键技术之一——定时与逻辑控制．该定时与逻辑控制电路通过模压预格式信号中的自同步位时钟与 Ｓ Ｍ 标志指示信号对模压预格式信号中的各个区段 （ Ｓ Ｍ ， Ｖ Ｆ Ｏ， Ａ Ｍ， Ｉ Ｄ， Ｐ Ａ） 在时域上定位，实现对具有高速非重复性的模压预格式信息的实时采集，从而满足检测系统对包括磁光盘扇区标头信号、跨道信号和推挽信号的模压预格式信息的测试要求． Discussion One of the key technologies in 5 X-density magneto-optical disk molded-in characterization - timing and logic control. The timing and logic control circuit compares the respective segments (SM, VFO, AM, ID, PA) in the stamped pre-format signal by embedding the self-synchronizing bit clock and SIM tag indication signal in the stamped pre- In the time domain to achieve real-time capture of pre-formatted information with high-speed non-repetitive pre-formatting to meet the testing requirements of the test system for pre-formatted information including molded-in header, cross-track and push- Claim.