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本文报导了提高MOS中小规模集成电路管芯成品率的研究结果.单片管芯成品率最高达到67.9%,批量管芯成品率最高达到57.3%,平均管芯成品率稳定在37.5%～49.2%之间.
In this paper, the results of research on improving the MOS die yield of small and medium scale integrated circuits (ICs) are reported. The yield of the monolithic die is up to 67.9%, that of the bulk die is up to 57.3% and the average die yield is stable at 37.5% to 49.2% between.