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本文提出了一个借助于 X 射线测定金属晶粒度的新计算方法.在本文中,由 K_αX 射线产生的衍射线被认为是由 K_α_1和 K_α_2X 射线产生的衍射线的综合结果.如果用计算半高宽度 B_c 来代替衍射线的半高宽度 B,那么计算待测金属的晶粒度就变得容易了.与传统方法相比,新方法所得结果约小15%.新方法具有计算简单,不用标准试样的优点.当需要大致估计金属晶粒度时,新方法是有价值的.
In this paper, a new calculation method for the determination of metal grain size by means of X-ray is proposed.In this paper, the diffraction line generated by K_α X-ray is considered as the composite result of the diffraction lines generated by K_α_1 and K_α_2 X- Width B_c instead of the half-height width B of the diffraction line, it is easy to calculate the grain size of the metal to be tested, which is about 15% less than that of the conventional method. The new method has the advantages of simple calculation without standard The Advantages of Specimens The new method is valuable when it is necessary to approximate the grain size of the metal.