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从同一排列的不同炮点位置的两张记录上识别了同一界面的反射波同相轴以后,就能同时计算反射波的参数和相对静校正值。反射波的参数是所计算的数值,而相对静校正值则是按最小二乘法确定的极小值。排列的同一点上的不同反射层的静校正值,应进行平均。对同一排列或排列的一部分多于两张记录的情况如多次复盖,也作了讨论。
After identifying the reflection wave events of the same interface from two records of the same array at different shot locations, the reflected wave parameters and relative static corrections can be calculated simultaneously. The parameters of the reflected wave are the calculated values, while the relative static correction is the minimum determined by the least square method. The static correction values of the different reflective layers on the same point arranged should be averaged. Also discussed are cases where there is more than two records of the same arrangement or arrangement, such as multiple coverings.