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本文对 X 射线应力测定中平行光束法和聚焦法的衍射几何进行了分析比较,认为两者在衍射几何上是一致的。为提高衍射线强度,从而提高应力测定的准确度,漫散谱线的平行光阑张角可增大到1.36°。实验及对结果的方差分析表明:光阑张角主要影响应力测定值;而定峰方法对应力测定值及应力测定误差均有显著的影响。应根据衍射线谱型选择适当的定峰方法。1/4高法及半高法具有较高的应力测定准确度和较好的谱型适应性。
In this paper, X-ray stress measurement parallel beam method and the focusing method of diffraction geometry analysis and comparison, that both in the diffraction geometry is consistent. In order to improve the diffraction line intensity and thus the accuracy of the stress measurement, the parallel aperture angle of the diffuse scattering line can be increased to 1.36 °. The experimental results and variance analysis of the results show that: the aperture angle mainly affects the stress measurement value; and the peak determination method has a significant impact on the stress measurement value and the stress measurement error. According to the diffraction pattern should choose the appropriate peak method. 1/4 high method and half high method have high accuracy of stress measurement and good spectral adaptability.