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提出一种利用反正切振镜控制波形矫正共聚焦显微镜中非线性扫描畸变的方法,利用FPGA与ARM相结合的方式实现了基于DDS技术的反正切控制波形的生成。实验表明,该方法能够取代传统上使用f-θ透镜的矫正方法,从而降低了激光扫描共聚焦显微镜的系统成本。
A new method to control nonlinear scanning distortion in confocal microscope with waveform correction is proposed. The generation of arc tangent control waveform based on DDS technology is realized by combining FPGA with ARM. Experiments show that this method can replace the traditional correction method using f-theta lens, thus reducing the system cost of laser scanning confocal microscope.