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论述了完全标定透射电镜像转角所需拍摄的二次曝光电子显微像的数量 ,推导了由已测的像转角间接计算其它像转角的一般公式。以PhilipsCM200电镜为实例 ,说明了测定像转角的基本步骤 ,并以实例说明怎样利用像转角 ,把衍射花样的晶体学信息传递给电子显微像。
The number of double exposure electron microscopy images required to completely calibrate the corner of the TEM image is discussed. The general formula for calculating the other image angles indirectly from the measured image angle is deduced. Taking Philips CM200 electron microscope as an example, the basic steps of measuring the rotation angle are described. An example is given to illustrate how to use the rotation angle to transfer the crystallographic information of the diffraction pattern to the electron microscopy.