在全面分析光电成像传感器噪声源的基础上,提出了采用光子响应非均匀性因子Φ来评价光子响应非均匀性噪声,确立了Φ的测试方法,搭建了具有双积分球结构的测试平台完成了测试,并通过比对实验分析了光子散粒噪声、暗噪声和电路读出噪声对测试结果的影响,最后详细分析了整个输出范围内,光子响应非均匀性噪声与入射辐照度的关系,为光电成像传感器其他指标的测试和光子响应非均匀性噪声校正提供了有力的支持。 Based on a comprehensive analysis of the noise sources of the photoelectric sensor, a photon-responsive nonuniformity factor Φ is proposed to evaluate the photon-response inhomogeneity noise. A test method of Φ is established. A test platform with double-integrating sphere structure is established The effects of shot noise, dark noise and circuit readout noise on the test results were analyzed by comparison experiments. Finally, the relationship between the photon response inhomogeneity noise and incident irradiance was analyzed in detail in the whole output range. It provides strong support for testing of other indicators of photoelectric imaging sensors and photon-responsive non-uniformity noise correction.