电子探针分析是近三十年来发展极为迅速的显微分析测试技术之一。它是用聚焦成1微米左右的电子束,直接轰击样品表面,在约1平方微米的区域内,对组成元素激发产生的特征X射线进行分光,从而求得其波长和强度,对该微区的元素进行定性和定量分析。探针分析引进地质工作,对鉴定细小矿 Electron probe analysis is one of the most rapid development of microscopic analysis and testing technology in recent thirty years. It is focused on the electron beam of about 1 micron, the direct bombardment of the sample surface in the area of ​​about 1 square microns, the composition of elements excited by the characteristics of X-ray spectroscopy to obtain the wavelength and intensity of the micro-area The elements of qualitative and quantitative analysis. Probes into the geological work, the identification of small mines