为了测定三氧化二钛中的微量硅，对萃取——分光光度测定法的某些操作步骤进行了改进和检验。利用Ｈ２ＴｉＯ３沉淀可将母体钛分离，硅的回收率大于９０％。稳定硅钼兰的还原状态后，可使分析的精密度大为提高。对钛氧化物中１０μｇ／ｇ量级硅的测定结果表明，该法能满足微量硅的分析要求 In order to determine the trace silicon in titanium dioxide, some of the steps of extraction-spectrophotometry were modified and tested. The parent Ti can be separated by precipitation with H2TiO3 and the recovery of silicon is over 90%. After the stability of molybdenum silicon reduction state, the precision of the analysis can be greatly improved. The results of the determination of 10 μg / g silicon in titanium oxide show that this method can meet the analytical requirements of trace silicon